About Ostec Corporate Group
Ostec Corporate Group produces and offers hi-tech innovative scientific and analytical equipment
Ostec Corporate group is an engineering company that provides complex engineering and consulting services in the field of electronics to improve the efficiency of enterprises and the competitiveness of their products.
Experience since 1991 and implementation of a large number of projects allow Ostec to offer its customers optimal solutions to problems regardless of the stage of development of their productions.
Facilitation of enterprise development includes:
analysis of market and technology development;
help in improving the design of the product;
design of production;
a full range of works on equipment and services;
support in view of market development and technology.
Ostec Corporate group today is:
500 highly qualified specialists;
10 categories of decisions on types of productions and processes;
200 partners - world's technological leaders;
2,500 completed modernization projects.
The NIOS series of nanomechanical testers is available in three platforms: NIOS Compact, NIOS Standard and NIOS Advanced. Depending on the size of the selected platform the device may comprise one, two of three of the following measurements modules:
Scanning nanomechanical tester
Atomic force microscope
Special modification of NIOS Standard instrument can be equipped with three-axis heterodyne interferometer used for application in linear displacements nanometrology.
Depending on the type of the platform, one extends the capabilities of the instrument with additional options such as a lateral force sensor, heating stage, high load option, acoustic emission sensor, reciprocating wear module, etc.
Wide-range nanoindenter module
The wide-range or instrumented nanoindenter module is designed to measure the mechanical properties of various materials using a wide range of applied loads and depths. The range of application spreads from sufficiently hard materials (sapphire and harder) to quite soft polymeric materials, plastics and some sorts of rubbers. This capability to conduct a measurement for the different types of materials is provided by the big displacement range of the shaft and by the method of load application.
This module is also used for the wear resistance measurements as well as for the scratch testing, which can be used for the mechanical and adhesive properties measurements. Using lateral force sensor it is possible to measure a lateral force and a friction coefficient.
Modes and methods:
• Instrumented indentation in accordance with ISO 14577
• Vickers hardness measurements
• Scratch tests (hardness measurements by scratching) with constant or variable load
• Dynamic stiffness measurements
• Beams and membranes stiffness measurements
• Hardness and elastic modulus dependency of the indentation depth
• Automated mapping of two- and three-dimensional hardness and elastic modulus distribution over the surface within the area of 50x50 mm
• Adhesion characterisation by the scratch method
• Measurements in liquids
• Additional option for the loads up to 30 N
The indentation module has 4 basic operating modes:
Additional units and sensors
NIOS nanomechanical testers have a lot of additional units and sensors. This extends the functionalities of the measurement system and provides a maximum level of device adaptation for customer's needs.
Measurement platform final configuration is selected depending on the customer's research tasks.
In order to deal with unusual research tasks it is possible to create new units, modify existing units and sensors and install on NIOS units from other manufacturers.
Lateral force sensor:
Lateral force measurements during sclerometry and polycyclic abrasion
Friction coefficient measurements during tribology tests
In-situ scanning unit:
SPM mode for a surface topography visualization by diamond indenter
Maximum temperature: 400 °C
Maximum heating rate: 1 °C/s
Temperature stabilization: 0,1 °C
Maximum sample dimensions (WxLxH): 25x25x10 mm
Measurement module of electrical properties:
Current-voltage characteristics and current spreading measurements during mechanical tests
Mechanical properties anisotropy research
Sample positioning expanded functionality
Indenter tips made of doped and high quality synthetic diamonds monocrystals
Berkovich triangular pyramid
Knoop four-sided pyramid
Vickers four-sided pyramid
Flat punch with a given diameter from 50 μm to 2 mm
Spherical tip with a given radius
Reference Sample (RS) is produced from a well-known material with special surface preparation. Reference samples are purposed for calibration of the NIOS devices and inspected to be compliant with established standards. Every RS has a passport of the RS containing standard metrology characteristics, application instruction and transportation and storing conditions.
Polycarbonate Reference characteristics:
hardness: 0.21 ± 0.02 GPa
elastic modulus (Young's modulus): 3 ± 0.3 GPa
roughness: <5 nm
dimensions: 10x10x7 mm
surface preparation: —
Aluminum Reference characteristics:
Hardness: 0.5 ± 0.1 GPa
Elastic modulus: 70,0 ± 7,0 GPa
Roughness: <5 nm
Dimensions: 10x10x8 mm
Surface preparation: polishing, electrolytic etching
Fused Silica Reference characteristics:
Hardness: 9.5 ± 1.0 GPa
Elastic modulus: 72.0 ± 3.0 GPa
Roughness: <5 nm
Dimensions: 7x10x4 mm
Surface preparation: deep grinding-polishing
Sapphire Reference characteristics:
Hardness: 24.5 ± 2.5 GPa
Elastic modulus: 415.0 ± 35.0 GPa
Roughness: <5 nm
Dimensions: 25x5 mm
Surface preparation: epi-polishing
IN-situ and EX-situ NIOS Nanomechanical Testers
The technologies underlying NIOS nanomechanical instruments have been developed by russian materials scientists and engineers since 1995. All technical solutions employed on NIOS instruments are protected by patents under Russian Federation.
The modular design of NIOS series allows end-users to configure a nanomechanical tester specifically for their needs and requirements. Configurations of NIOS nanomechanical tester can consist of the following modules:
Atomic Force Microscope
Scanning nanomechanical tester
Electrical Properties Measurement
Lateral Force Sensor
In-situ Topography Imaging
NIOS Advanced is the flagship model which implements more than 30 different measuring techniques covering all types of physical and mechanical properties measurements at the submicron and nanometer scale.
With NIOS control software a high degree of automated measurements can be achieved allowing the end-user to configure any set of measurements recipes to be performed without operator intervention. This feature is particularly useful for the technical control of the materials quality. With this added functionality, NIOS can be used for research work as well as for industrial applications.
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