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About Ostec Corporate Group

Ostec Corporate Group produces and offers hi-tech innovative scientific and analytical equipment

Ostec Corporate group is an engineering company that provides complex engineering and consulting services in the field of electronics to improve the efficiency of enterprises and the competitiveness of their products.

 

Experience since 1991 and implementation of a large number of projects allow Ostec to offer its customers optimal solutions to problems regardless of the stage of development of their productions.

Facilitation of enterprise development includes: 

  • analysis of market and technology development;

  • help in improving the design of the product;

  • design of production;

  • a full range of works on equipment and services;

  • support in view of market development and technology.

 

 

Ostec Corporate group today is: 

  • 500 highly qualified specialists;

  • 10 categories of decisions on types of productions and processes;

  • 200 partners - world's technological leaders;

  • 2,500 completed modernization projects.

The  NIOS  series  of  nanomechanical  testers  is  available  in three  platforms:  NIOS  Compact,  NIOS  Standard  and  NIOS Advanced.  Depending  on  the  size  of  the  selected  platform the device  may comprise one,  two  of three of the following measurements modules:
 

  • Wide-range nanoindenter

  • Scanning nanomechanical tester

  • Atomic force microscope

  • Optical  microscope


Special  modification  of  NIOS  Standard  instrument  can  be equipped with three-axis heterodyne interferometer used for application  in  linear displacements nanometrology.

Depending  on  the  type  of  the  platform,  one  extends  the capabilities  of  the  instrument  with  additional  options  such as  a  lateral  force  sensor,  heating  stage, high  load  option, acoustic emission sensor, reciprocating wear module, etc.

Wide-range nanoindenter module

 

Purpose:


The wide-range or instrumented nanoindenter module is designed to measure the mechanical properties of various materials using a wide range of applied loads and depths. The range of application spreads from sufficiently hard materials (sapphire and harder) to quite soft polymeric materials, plastics and some sorts of rubbers. This capability to conduct a measurement for the different types of materials is provided by the big displacement range of the shaft and by the method of load application.
 

This module is also used for the wear resistance measurements as well as for the scratch testing, which can be used for the mechanical and adhesive properties measurements. Using lateral force sensor it is possible to measure a lateral force and a friction coefficient.

Modes and methods:


•  Instrumented indentation in accordance with ISO 14577
•  Vickers  hardness measurements
•  Scratch tests (hardness  measurements by scratching) with constant or variable load
•  Dynamic stiffness measurements
•  Beams and membranes stiffness measurements
•  Hardness and elastic modulus dependency of the indentation depth
•  Automated  mapping of two- and three-dimensional hardness and elastic modulus distribution over the surface within the area of 50x50 mm
•  Adhesion characterisation by the scratch  method
•  Measurements in liquids
•  Additional option for the loads  up to 30 N

 

Technical data:


The  indentation  module  has  4  basic  operating  modes:

Additional units and sensors

 

NIOS nanomechanical testers have a lot of additional units and sensors. This extends the functionalities of the measurement system and provides a maximum level of device adaptation for customer's needs.

 

Measurement platform final configuration is selected depending on the customer's research tasks.

 

In order to deal with unusual research tasks it is possible to create new units, modify existing units and sensors and install on NIOS units from other manufacturers.

 

Lateral force sensor:

 

Lateral force measurements during sclerometry and polycyclic abrasion

Friction coefficient measurements during tribology tests

 

In-situ scanning unit:

 

SPM mode for a surface topography visualization by diamond indenter

 

Heating stage:

 

Maximum temperature: 400 °C

Maximum heating rate:  1 °C/s

Temperature stabilization: 0,1 °C

Maximum sample dimensions (WxLxH): 25x25x10 mm

 

Measurement module of electrical properties:

Current-voltage characteristics and current spreading measurements during mechanical tests

 

Sample holders:

 

Vises

Clamps

Supports

Vacuum cups

 

Rotary table:

 

Mechanical properties anisotropy research

Sample positioning expanded functionality

 

Indenters:

 

Indenter tips made of doped and high quality synthetic diamonds monocrystals

Berkovich triangular pyramid

Knoop four-sided pyramid

Vickers four-sided pyramid

Flat punch with a given diameter from 50 μm to 2 mm

Spherical tip with a given radius

 

Reference samples:

 

Reference Sample (RS) is produced from a well-known material with special surface preparation. Reference samples are purposed for calibration of the NIOS devices and inspected to be compliant with established standards. Every RS has a passport of the RS containing standard metrology characteristics, application instruction and transportation and storing conditions.

 

Polycarbonate Reference characteristics:

 

hardness: 0.21  ± 0.02 GPa

elastic modulus (Young's  modulus): 3 ± 0.3 GPa

roughness: <5 nm

dimensions: 10x10x7 mm

surface preparation: —

 

Aluminum Reference characteristics:

 

Hardness: 0.5 ± 0.1  GPa

Elastic modulus: 70,0 ± 7,0 GPa

Roughness: <5 nm

Dimensions: 10x10x8 mm

Surface preparation: polishing, electrolytic etching

 

Fused Silica Reference characteristics:

 

Hardness: 9.5 ± 1.0 GPa

Elastic modulus: 72.0 ± 3.0 GPa

Roughness: <5 nm

Dimensions: 7x10x4 mm

Surface preparation: deep grinding-polishing

 

Sapphire Reference characteristics:

 

Hardness: 24.5 ± 2.5 GPa

Elastic modulus: 415.0 ± 35.0 GPa

Roughness: <5 nm

Dimensions: 25x5 mm

Surface preparation: epi-polishing

IN-situ and EX-situ NIOS Nanomechanical Testers

About NIOS

The  technologies  underlying  NIOS  nanomechanical instruments  have  been  developed  by  russian  materials scientists  and  engineers since  1995.  All  technical  solutions employed on NIOS instruments are protected by patents under Russian  Federation.

The  modular  design  of  NIOS  series  allows  end-users to  configure  a  nanomechanical  tester  specifically  for  their needs  and  requirements. Configurations of NIOS nanomechanical tester can consist of the following modules:
 

  • Wide-range nanoindenter

  • Optical Microscope

  • Atomic Force Microscope

  • Scanning nanomechanical tester

  • Electrical  Properties Measurement

  • Lateral Force Sensor

  • In-situ Topography Imaging

  • Heating Stage


NIOS Advanced is the flagship  model which implements more  than 30  different  measuring  techniques  covering  all types of physical and  mechanical  properties measurements at the submicron and  nanometer scale.

With NIOS control software a high degree of automated measurements  can  be  achieved  allowing  the  end-user  to configure any set of measurements recipes to be performed without  operator  intervention.  This  feature  is  particularly useful  for  the  technical  control  of  the  materials  quality. With  this  added  functionality,  NIOS  can  be  used  for research work as well  as for industrial applications.

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